Advanced Microscopy Techniques (AMT) has devoted its design and manufacturing efforts toward the goal of providing excellence in digital camera imaging systems for the TEM.
These systems are sold directly to customers, through domestic and international representatives, and through TEM vendors. With an installed based of over 1100 camera systems, AMT has developed a substantial local and international infrastructure in optics, electronics, software, sales and support. Our use of the best available technologists working together provide excellent customer communication and knowledge. This team approach allows AMT to supply world-class products on a global scale at competitive prices. As a result, AMT enjoys an excellent reputation for reliability and support for both its products and its customers.
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Phone: 978-774-5550 Fax: 978-739-4313 Email: firstname.lastname@example.org
Advanced Microscopy Techniques (AMT) was begun in 1991 as a sole proprietorship by James Mancuso, Ph.D.
Mancuso's career began at Westinghouse's R&D Center and Combustion Engineering where he worked in materials characterization and developed image processing algorithms for semi-conductor inspection and quantitative materials analysis.
Later at ElectroScan he patented the first environmental secondary electron detector and designed ElectroScan's prototype ESEM.
Then at JEOL USA he developed electron optics, electron and ion detectors, SEM metrology systems and motion control modules.
AMT's initial product was adapted from Lee Peachy's (U of Penn) concept of using high-speed machine-vision CCDs at the TEM's "35 mm port". Taking this concept to reality, AMT build the first high-definition, wide-angle camera system in 1991.
In 1992 Leo Fama, who had extensive experience in electro-mechanical design and packaging of semi-conductor equipment and scientific instrumentation, joined AMT as a partner.
Fama expanded the application of fast CCD cameras to virtually all existing TEMs. At the same time, he spearheaded the application of Deben UK's stage control products to semiconductor inspection in SEMs.
He has also headed the sales and support of other Deben products for specimen cooling and SEM beam blanking.
In 1995, experienced TEM microscopist, Charles Bradley, Ph.D. joined to head application software and round out the development team.
Bradley is a physicist who has held positions at Argonne National Laboratory in TEM and 4Pi as an applications software specialist. He has been instrumental in integrating AMT cameras with TEM control systems and extending the application of CCD cameras.
His goal is for the software to be a streamlined acquisition engine that is as efficient as possible, while also recognizing that image processing and acquisition are separate operations.
Physics degree from the University of Wisconsin - Madison
Joined AMT in 2004
Specialization: Installations, Service and Training
Editor and producer of Braille textbooks
Joined AMT: 2009
Title: Technical Manager
Mechanical Drawing, Customer Relations, and Component Procurement
Joined AMT: 2014
Title: Technical Sales Specialist
Quotes, Product Demonstrations, and OEM relations
Title: Production Support
Duties Include: Mechanics Assembly, Lens Alignment, and Computer Assembly
19 years at AMT
Administration, Accounts Payable, Accounts Receivable, Payroll and Insurance, and Show Coordination
1995: was a big year for AMT, as there were many important developments for the company.
1998: AMT developed its second finite-conjugate lens, the highly regarded A-lens, for the Advantage HR camera for TEM, which resulted in 3 times higher sensitivity, 2 times faster response, and also had significantly better image quality than previous models.
2000: AMT introduced the Advantage Plus, the first 4 megapixel Side-Mounted TEM camera, again combining progressive scan CCDs with finite-conjugate optics. This was closely followed by the XR60 Side-Mounted camera featuring over 6 megapixels.
2001: AMT developed the C-lens and XR100 TEM camera, which was a 7 megapixel "biological bottom mounted camera" with a very large image pick-up.
2005: AMT’s XR60 was extended to 10.5 megapixels.
2006: AMT adopted Kodak's line of 35 mm format CCDs, which have the best price/pixel ratio available. AMT also introduced the Zoom concept for TEM cameras, whereby the digital camera could be position optimally near the TEM's traditional plate film plane.
2007: AMT introduced its 16000 series, (current XR16), of high speed 16 megapixel TEM cameras. In addition AMT entered an ISV partnership with MicroSoft to integrate database capabilities directly into the camera acquisition software.
2008: AMT introduced 2Vu™. It's method and apparatus allow simultaneous direct viewing and electronic capture of images in a transmission electron microscope (TEM).
2011: 2Vu™ has obtained the patent.
Introduction of the XR50 (5 megapixel), XR80 (8 megapixel) CCD cameras, as well as the XR280 (2.8 megapixel) and the XR550 (5 megapixel) sCMOS camera for transmission electron microscopy (TEM).
AMT Capture Engine Software version 602 became compatible on both XP and Windows 7.